【EASY EAI Nano开源套件试用体验】存储性能测试

本文来源电子发烧友社区，作者：李先生， 帖子地址：https://bbs.elecfans.com/jishu_2308803_1_1.html


前言

嵌入式平台存储是影响综合性能的重要因素，所以本次对RAM和EMM性能进行测试，RAM压力测试也是一个重要的测试用例，尤其是在高低温等情况下测试，可以考察系统的稳定性。

过程RAM性能测试

WSL中

下载代码

git clonehttps://github.com/qinyunti/STREAM.git

cd STREAM/

编译

ARM-linux-gnueabihf-gcc -O3 stream.c -o stream

导出到windows下

cp stream /mnt/d

然后通过串口rz导入到开发板

添加可执行权限

chmod +x stream

运行

./stream

结果如下

1. [root@EASY-EAI-NANO:/]# ./stream
3. -------------------------------------------------------------
5. STREAM version $Revision: 5.10 $
7. -------------------------------------------------------------
9. This system uses 8 bytes per array element.
11. -------------------------------------------------------------
13. Array size = 10000000 (elements), Offset = 0 (elements)
15. Memory per array = 76.3 MiB (= 0.1 GiB).
17. Total memory required = 228.9 MiB (= 0.2 GiB).
19. Each kernel will be executed 10times.
21. The *best* time for each kernel (excluding the first iteration)
23. will be used to compute the reported bandwidth.
25. -------------------------------------------------------------
27. Your clock granularity/precision appears to be 1 microseconds.
29. Each test below will take on the order of 74402 microseconds.
31. (= 74402 clock ticks)
33. Increase the size of the arrays if this shows that
35. you are not getting at least 20 clock ticks per test.
37. -------------------------------------------------------------
39. WARNING -- The above is only a rough guideline.
41. For best results, please be sure you know the
43. precision of your system timer.
45. -------------------------------------------------------------
47. Function Best Rate MB/sAvg time Min time Max time
49. Copy: 2213.1 0.072951 0.072296 0.073413
51. Scale: 1526.0 0.105517 0.104846 0.108350
53. Add: 1181.8 0.203954 0.203082 0.205791
55. Triad: 954.5 0.253434 0.251431 0.255541
57. -------------------------------------------------------------
59. Solution Validates: avg error less than 1.000000e-13 on all three arrays
61. -------------------------------------------------------------
63. [root@EASY-EAI-NANO:/]#

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参考https://www.cs.virginia.edu/stream/ref.html

RAM压力测试

参考https://pyropus.ca./software/memtester/

WSL中

下载代码

wgethttps://pyropus.ca./software/mem ... tester-4.5.1.tar.gz

tar -xvf memtester-4.5.1.tar.gz

cd memtester-4.5.1/

编译

arm-linux-gnueabihf-gcc -O3 memtester.c tests.c -o memtester

导出到WINDOWS下,下载到开发板

cp memtester /mnt/d

chmod +x memtester

运行

./memtester

运行结果如下,默认一直测试下去,可以最后指定测试次数

比如

./memtester128M 1

128M表示测试RAM大小

1表示测试一次

另外也可以-p直接指定物理地址,适合在板子开发阶段裸机代码直接指定物理地址测试。

1. [root@EASY-EAI-NANO:/]# ./memtester 128M 1
3. memtester version 4.5.1 (32-bit)
5. Copyright (C) 2001-2020 Charles Cazabon.
7. Licensed under the GNU General Public License version 2 (only).
11. pagesize is 4096
13. pagesizemask is 0xfffff000
15. want 128MB (134217728 bytes)
17. got128MB (134217728 bytes), trying mlock ...locked.
19. Loop 1/1:
21. Stuck Address : ok
23. Random Value : ok
25. Compare XOR : ok
27. Compare SUB : ok
29. Compare MUL : ok
31. Compare DIV : ok
33. Compare OR : ok
35. Compare AND : ok
37. Sequential Increment: ok
39. Solid Bits : ok
41. Block Sequential : ok
43. Checkerboard : ok
45. Bit Spread : ok
47. Bit Flip : ok
49. Walking Ones : ok
51. Walking Zeroes : ok
55. Done.

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EMMC性能测试

dmesg | grep mmc

4GEMMC

[ 0.626234] mmc0: new HS200 MMC card at address 0001

[ 0.628264] mmcblk0: mmc0:0001 8GTF4R 7.28 GiB

EMMC速度为HS200

Speed Mode	clock (MHz)
Default Speed	26
Hight Speed SDR	52
Hight Speed DDR	52
HS200	200
HS400	200

df查看,使用/userdata目录进行读写测试

1. [root@EASY-EAI-NANO:/]# df
3. Filesystem 1K-blocks Used Available Use% Mounted on
5. /dev/root 1531442 593804 86391741% /
7. devtmpfs 456488 0 456488 0% /dev
9. tmpfs 457000 0 457000 0% /dev/shm
11. tmpfs 457000 204 456796 0% /tmp
13. tmpfs 457000 380 456620 0% /run
15. /dev/mmcblk0p7 127955 1684 122289 1% /oem
17. /dev/mmcblk0p8 5632783 38040 5370524 1% /userdata

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	bs/count1GB	指令	结果
读	16k/65536	timedd if=/userdata/test.bin of=/dev/null bs=16k count=65536	109MB/S
	4k/262144
	1k/1048576
写	16k/65536	timedd if=/dev/zero of=/userdata/test.bin bs=16k count=65536	38MB/S
	4k/262144
	1k/1048576

1. [root@EASY-EAI-NANO:/]# time dd if=/dev/zero of=/userdata/test.bin bs=16k count=
3. 65536
5. 65536+0 records in
7. 65536+0 records out
9. real 0m 26.85s
11. user 0m 0.08s
13. sys 0m 16.77s
15. [root@EASY-EAI-NANO:/]# time dd if=/userdata/test.bin of=/dev/null bs=16k count=
17. 65536
19. 65536+0 records in
21. 65536+0 records out
23. real 0m 9.36s
25. user 0m 0.10s
27. sys 0m 4.54s
29. [root@EASY-EAI-NANO:/]#

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以上仅作参考，实际欸有考虑缓存的影响。

SD卡性能测试

同EMMC测试,测试过程略。

SD卡自动挂载在/mnt/sdcard

总结

以上测试来看，性能是不错的，测试方法不是完全科学，比如EMMC读写没有考虑缓存，所以测试结果仅作参考。不同测试环境结果也可能不一样。